Huhtinen H., Golmar F., Acha C., Sanca G.A., Barella M., Alurralde M., Marlasca F.G., Paturie P., Levy P.
Ключевые слова: HTS, YBCO, thin films, substrate LaAlO3, chemical solution deposition, fabrication, multilayered structures, magnetron sputtering, protection layer Ag, protection layer Au, interfaces, critical caracteristics, critical current density, heat treatment, microstructure, Raman spectroscopy, experimental results
Ключевые слова: HTS, YBCO, films, substrate sapphire, protection layer Au, FCL resistive, modeling computational, overcurrent, power equipment
Ключевые слова: HTS, YBCO, films, substrate LaAlO3, substrate single crystal, protection layer Au, FCL resistive, dc performance, pulsed operation, power equipment
Ключевые слова: FCL inductive, current limiting characteristics, core saturated, HTS, YBCO, films, protection layer Au, experimental results, power equipment
Ключевые слова: FCL resistive, HTS, YBCO, films epitaxial, substrate sapphire, protection layer Au, numerical analysis, power equipment
Ключевые слова: HTS, YBCO, films, protection layer Au, substrate single crystal, recovery characteristics, FCL resistive, experimental results, power equipment
Ключевые слова: HTS, YBCO, coated conductors, mechanical strain, mechanical properties, substrate CeO2/IBAD-YSZ/Ni alloy, ISD process, buffer layers, REBCO, co-evaporation process, protection layer Au, critical current, bending process, stress effects, microstructure, experimental results, critical caracteristics, fabrication
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